Bibliography 1005

 

[1] M. A. Van Hove, W. H. Weinberg, and C.-M- Chan, Low-Energy Electron Diffraction, Experiment, Theory and Surface Structure Determination, Springer Series in Surface Science, Vol. 6, G. Ertl and R. Gomer (Eds.), Springer Verlag, Heidelberg, 1986 (out of print).

[2] M. A. Van Hove and S. Y. Tong, Surface Crystallography by LEED, Springer Verlag, Heidelberg, 1979.

[3] J. B. Pendry, Low-Energy Electron Diffraction, Academic Press, London, 1974.

[4] E. A. Wood, J. Appl. Phys. 35, 1306 (1964).

[5] International Tables for X-ray Crystallography, Vol. I Symmetry Groups, eds. N.F.M. Henry and K. Lonsdale, Kynoch Press (Birmingham, England), 1965, pp. 6, 45-47, 57-72.

[6] K. Hermann, Crystallography and Surface Structure, an Introduction for Surface Scientists and Nanoscientists, Wiley-VCH, Berlin 2011, ISBN 978-3-527-41012-5.

[7] Supplement 4 within the following book contains many LEED patterns that have more general validity than for Si alone: V.G. Lifshitz, A.A. Saranin and A.V. Zotov, Surface Phases of Silicon, Wiley, Chichester (1994).

[8] SARCH/LATUSE/PLOT3D software download at http://www.fhi-berlin.mpg.de/KHsoftware/SLP/. Program SARCH also displays LEED patterns, but with the option of kinematic intensities being shown. It is, however, less user-friendly than LEEDpat.

[9] P. R. Watson, M. A. Van Hove and K. Hermann, NIST Surface Structure Database Ver. 4.0, NIST Standard Reference Data Program, Gaithersburg, MD, USA (2001).