M. A. Van Hove, W. H. Weinberg, and C.-M- Chan, Low-Energy Electron Diffraction, Experiment, Theory and Surface Structure Determination, Springer Series in Surface Science, Vol. 6, G. Ertl and R. Gomer (Eds.), Springer Verlag, Heidelberg, 1986 (out of print).
 M. A. Van Hove and S. Y. Tong, Surface Crystallography by LEED, Springer Verlag, Heidelberg, 1979.
 J. B. Pendry, Low-Energy Electron Diffraction, Academic Press, London, 1974.
 E. A. Wood, J. Appl. Phys. 35, 1306 (1964).
 International Tables for X-ray Crystallography, Vol. I Symmetry Groups, eds. N.F.M. Henry and K. Lonsdale, Kynoch Press (Birmingham, England), 1965, pp. 6, 45-47, 57-72.
 K. Hermann, Crystallography and Surface Structure, an Introduction for Surface Scientists and Nanoscientists, Wiley-VCH, Berlin 2011“, ISBN 978-3-527-41012-5.
 Supplement 4 within the following book contains many LEED patterns that have more general validity than for Si alone: V.G. Lifshitz, A.A. Saranin and A.V. Zotov, Surface Phases of Silicon, Wiley, Chichester (1994).
 SARCH/LATUSE/PLOT3D software download at http://www.fhi-berlin.mpg.de/KHsoftware/SLP/. Program SARCH also displays LEED patterns, but with the option of kinematic intensities being shown. It is, however, less user-friendly than LEEDpat.
 P. R. Watson, M. A. Van Hove and K. Hermann, NIST Surface Structure Database Ver. 4.0, NIST Standard Reference Data Program, Gaithersburg, MD, USA (2001).